In SAXS, extremely low-angle X-rays scattered from a sample are detected, enabling the measurement of membrane thicknesses and particle sizes of the order of nanometers.
In our measurement device, which uses the MIRRORCLE-CV series synchrotron light source, characteristic X-rays can be produced by interchanging the target.
Mo target with Mo-Kα radiation (17.48 keV)
(Left) Reflectivity measurement of a vapor-deposited aluminum film (78.2 nm)
(Right) Reflectivity measurement of silicone
Analysis example : particle size determination of gold microparticles
Angular dispersion or energy dispersion
|Optical system||Triple-slit optical system|
|Sample configuration (film thickness measurement)||Film deposited onto a matrix by vaporization or other means|
|Sample configuration (particulate)||Powder|
|Sample size||Contact us|
Tens of nm〜
Hundreds of nm