X-ray absorption fine structure (XAFS) can be used to investigate the structural status near specific atoms; it can be implemented in material analysis and other applications.
Two types of XAFS are considered: Extended XAFS (EXAFS) and Near-Edge XAFS (NEXAFS): EXAFS can obtain the radial distribution around specific atoms and provide the types and numbers of atoms.
It is a powerful tool for the analysis of storage batteries and for the development of catalysts. It is also suited for the analysis of environmental chemicals.
Atoms that can be analyzed
|Energy resolution||ΔE / E = 5,000|
|Sample form||Solid, thin film, liquid, powder|
|Sample thickness||Few μm〜tens of μm|
|Sample size||10 x 30mm|