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X-Ray Fluorescence Analysis(XRF)
X-ray fluorescence analysis of all elements with ppm precision
General X-ray fluorescence devices can only detect elements of atomic number up to 40 because of the low-energy X-ray used. Thus, large-scale synchrotrons, such as Spring-8, have been the only devices capable of analyzing heavy metals using X-ray fluorescence. With MIRRORCLE, X-ray fluorescence analysis of heavy metals can be easily performed; by selecting the target and varying the operational conditions, not only traces of light elements such as calcium, but also heavy elements such as lead can be detected.
Analysis apparatus : Total reflective X-ray fluorescence analysis beam line
| Light source | MIRRORCLE-CV1、CV4、6x |
| Measurement Energy range | 3〜100keV |
| Quantitative Analysis | Calibration curve method using standard samples |