X-ray diffraction is used to measure the residual stress inside mechanical components and other building objects. MIRRORCLE uses high-energy white X-ray, which enable deep and non-destructive measurements. Furthermore, the energy dispersive method allows measuring of complex shapes.
Diffracted X-rays at specific depths are measured by varying the sample orientation; the stress is calculated from the extent of the energy shift. Fe (110) X-ray diffraction peak graph (center figure) measured for a tooth in a helical gear (depth 0.2 mm) and residual stress (right figure).
These plots show that the tensile stress turns into compressive stress at a depth of 0.2 mm.
Our results using MIRRORCLE:
From stress gauge
|Optical system||Parallel optical system|
|Detector||Germanium semiconductor detector|
|X-ray diameter||Less than 500μm（※）|
|Measurement region||Less than 1cm（※）|
|Maximum measurement depth||Less than 1mm for steel（※）|
|Depth resolution||Greater than 1μm（※）|
※Depends on conditions of measurement