XAFS

 

EXAFS can be used to analyze the chemical status

 

  X-ray absorption fine structure (XAFS) can be used to investigate the structural status near specific atoms; it can be implemented in material analysis and other applications.

  Two types of XAFS are considered: Extended XAFS (EXAFS) and Near-Edge XAFS (NEXAFS): EXAFS can obtain the radial distribution around specific atoms and provide the types and numbers of atoms.

  It is a powerful tool for the analysis of storage batteries and for the development of catalysts. It is also suited for the analysis of environmental chemicals.

 

 

 

Analysis apparatus  :  XAFS measurement beam line

 

 

 

 

X-ray source	MIRRORCLE-CV4
X-ray energy	10〜25keV
Atoms that can be analyzed	K shell：Ga(31)〜In(49) L shell：Tl(81)〜U(92)
Energy resolution	ΔE / E = 5,000
Sample form	Solid, thin film, liquid, powder
Sample thickness	Few μm〜tens of μm
Sample size	10 x 30mm

 

 

 

Click here for enquiries on commissioned analyses.