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Please contact MIRRORCLE ANALYSIS CENTER
for inquiries about analysis service.
X-ray diffraction (XRD) can obtain information on angstrom order such as arrangement of atoms by measuring scattering X-rays at a relatively wide angle from the sample.
For apparatus using the MIRRORCLE-CV series as a light source, you can use arbitrary characteristic X-rays by replacing the target.
Analyze apparatus : Protein structure analysis beam line
Spectrometer chamber, set of goniometer and CCD detector for protein structure analysis