X-ray diffraction is used to measure the residual stress inside mechanical components and other building objects. MIRRORCLE uses high-energy white X-ray, which enable deep and non-destructive measurements. Furthermore, the energy dispersive method allows measuring of complex shapes.
|Optical system||Parallel optical system|
|Detector||Germanium semiconductor detector|
|X-ray diameter||Less than 500μm（※）|
|Measurement region||Less than 1cm（※）|
|Maximum measurement depth||Less than 1mm for steel（※）|
|Depth resolution||Greater than 1μm（※）|
※Depends on conditions of measurement